Items where Author is "Xu, Linyan"

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Dai, Gaoliang and Xu, Linyan and Hahm, Kai (2020) Accurate tip characterization in critical dimension atomic force microscopy. Measurement Science and Technology, 31 (7). 074011. ISSN 0957-0233

This list was generated on Sat Nov 23 01:35:28 2024 UTC.